- Pickering Interfaces Inc.
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PXI Programmable Resistor Card 4-Channel 2 Ohm to 63.7 Ohm
40-294-011
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Lamp Start, Run-up time and Flicker Test
LSRF-2
The (EU) NO 1194/2012rules
. Compared with which posted by theEuropean Commission Regulation (EC) NO 244/2009 Regulations dated 18th March, 2009, the new rules have complete mandatory and eco-design requirements. Start and Run-up time as the two indicators functional requirements in the industry has been more emphasis by manufacturers. -
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Harmonics & Flicker Analyser
AC2000A
The Laplace Harmonics and Flicker analyser provides the user with a complete system for testing product compliance with IEC61000-3-2 and IEC61000-3-3. Quick and easy to use, the built-in screen provides a clear pass/fail indication of compliance status, plus a full listing of results for each harmonic, in either tabular of bargraph format. The instrument is properly configured to cope with fluctuating harmonics. The Flicker mode provides proper measurement of short term and long term parameters,...show more -
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Harmonics And Flicker Measuring System
ProfLine Series
The Teseq ProfLine system is a complete and cost effective Harmonics and Flicker measurement test system which compiles to the latest IEC/EN standards, including IEC 61000-3-2 and IEC 61000-3-3. The programmable power generation capability of up to 45 kVA (90 kVA and 145 kVA sources comprise multiple 45 kVA units) provides more than ample power to cater for a wide range of Equipment Under Test (EUT).
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Harmonics and Flicker Testers
complied standards and features of the KHA1000 (dedicated for single phase), is equipped for the harmonic and flicker compliance test exceeding 16A of the single-phase and three-phase equipment. With this unit alone, you can take highly accurate simultaneous three-phase measurements up to 40A/phase*.
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Spectral Light And Color Meter w/ Flicker measurement
BTS256-EF
Spectroradiometer for the illuminance (photopic, scotopic, melanopic), spectrum, light color, color rendering index, and flicker. Cosine field of view illuminance measurement for accurate evaluation of extended illumination. Flicker measurement. Spectral measurement technology, required for LED light, color, color rendering, color effects. Photodiode for synchronization to pulse width modulated light and flicker measurement.
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Custom Test Fixtures
Cortek Test Solution’s design capabilities range from very basic to extremely sophisticated solutions. Developing custom test fixtures demands more engineering time as well as an in-depth knowledge of mechanical design, pcb test methods paired with precision machining. Our experienced engineers will evaluate your requirement and design innovative mechanical test fixtures to meet your application needs in both the R & D and production environments.
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RF Shielded Test Enclosure, I/O Intensive Device Tests
JRE 1720
Like its other brothers in the JRE test line, it features rugged welded aluminum construction with superb RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble-free operation over its lifespan. A JRE exclusive, our triple door locking mechanism allows easy single handle door operation. Ventilation is standard with our JRE exclusive honeycomb style vents in enclosure rear and door.
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Leak Test Instrumentation
At Cincinnati Test Systems (CTS), we are dedicated to providing our customers with superior quality leak testing systems. With access to advanced designs, features, and test algorithms in our leak test devices, we promise a fast and reliable leak test product that will also provide repeatable results for air leakage testing, gas leakage testing, or any other leak where reliable testing equipment is needed. Browse our family of products to learn more on how our standard and custom built systems can meet your needs:
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Mixed Signal Test Systems
MTS1010i
The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Mixed Signal Test Systems
MTS2010i
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Modular Test System
A modular test system, RTS (real time scanner) provides instant test results with minimal interface cables to check wiring during installation.It tests wire harnesses in real time using our micro switching technology, reducing the need for high cost interface cables by around 90%. an innovative best-in-class solution for FAL testing, RTS also offers many benefits for wire harness and sub-assembly manufacturers.
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In‐Circuit Test Fixtures
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solut...show more -
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Test Socket
Our test sockets are made for high performance and are of top quality, to guarantee a smooth, effortless process. We believe in providing our partners and customers with effective and intelligent solutions that they can apply with ease. Choose the solutions of TTS Group cater to the needs of detailed and complex systems.
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MANIA TEST PROBE
SERIES 76
ElectricalMAXIMUM CURRENT: 3 amps continuousat working travel, non - inductiveRESISTANCE: At 35 mA test current,50 mOHMS meanMaterial and FinishesPLUNGER: Heat treated berylliumcopper, FINISH: -2E / -2P Hard nickel plated-2D / -2E138 24 Kt gold plated,BARREL: Phosphor bronze, nickel platedSPRING: Stainless steel, silver platedPIN: Music wire, hard nickel plated
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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Universal Test Machines
AMETEK Sensors, Test & Calibration
he single column test stands offer a wide range of materials testing possibilities no matter what your testing needs are. Use the force testing machines for compression testing (Push) and tensile testing (Pull), or to perform a wide variety of tests on the universal materials testing machines.
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Threaded Probes Designed for Connector and Harness Test
Equip-Test Threaded Probes Designed for Connector and Harness Test
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Modular Test Platform
A modular test platform with a wide selection of modules allows optimal configuration of test solutions for optical component and network systems manufacturing.
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Vacuum Leak Test Systems
Vacuum leak testing is the principal leak test method for testing parts that could have leakage from an external source into their housings and casings. Parts like underwater sensors or housings, outdoor electrical housings, sealed components, and components associated with vacuum sources are all prime candidates for vacuum leak testing. Operation of instruments that supply vacuum to test parts instead of pressure works in a similar, yet essentially opposite, manner as pressure decay testing.
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Test Fixture Kits
Our test fixture kits provide cost effective solutions to printed circuit board testing and other devices under test. Our modular kits are available in multiple sizes and configurations. They can easily be customized if our standard doesn’t meet your requirements. Removable side panels for ease of fabrication for I/O connections, switches or other hardware.
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Test fixtures
Offers a wide range of standard Test Fixtures that can fit many of your applications and services. From your R & D to your production lines, we have a solution for you.Each products are standard but we can adapt or design your application.
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test p...show more -
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Sound Level Test System
In a world where precision and performance rule, measuring and controlling sound levels can be crucial to the success of your product or project. The team at Integrated Test & Measurement (ITM) have developed a customized solution that not only measures and collects sound-level data, but will help your team identify the specific components causing all that noise.
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802.11a,b,g RF Shielded Test Enclosure
JRE 0814-A
Testing tall devices? The 0814-A stands up to any test up to 18 GHz! Featuring a wide swing open door with durable latch handle, this enclosure is ideal for testing IEEE 802.11 a,b,g devices such as; WLAN, VoIP, access points and other RF devices.
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Automated Test Handler
In-Line Duomax
100 % Automated Fixture Change1.5 N x 8000 Test PointsICT FCT EOL IntegrationHigh ProductivityHigh QualityGreat ROINo PLC